V. Kashyap, J. Drake
We describe a Markov-Chain Monte-Carlos process using a Metropolis algorithm to derive Differential Emission measures (DEMs) from EUV line fluxes. This technique allows us to (a) relax the smoothness constraint generally imposed on DEMs, (b) determine the confidence bounds on the computed values, and (c) include more information in the form of upper limits. We apply this method to solar spectral line data from SERTS (Solar EUV Rocket Telescope and Spectrograph) and discuss the features in the derived DEM
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